Single molecule labeling of an atomic force microscope cantilever tip

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Scanned-cantilever atomic force microscope

We have developed a 3.6 pm scan range atomic force microscope that scans the cantilever instead of the sample, while the optical-lever detection apparatus remains stationary. The design permits simpler, more adaptable sample mounting, and generally improves ease of use. Software workarounds alleviate the minor effects of spurious signal variations that arise as a result of scanning the cantilev...

متن کامل

Sensitivity of an Atomic Force Microscope Cantilever with a Crack

The atomic force microscope (AFM) has become an essential tool for the measurement of surface characteristics of diverse materials on a microand nanoscale level [1]. The resolution of measurements for the AFM cantilever is related to its vibration sensitivity. Many researchers have much interest in studying the resonant frequency and sensitivity analysis of AFM cantilevers [2 4]. Cracks may be ...

متن کامل

Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope.

In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanner's fast performance, and because repeated exchange of ...

متن کامل

Reconstitution of phospholipid bilayer by an atomic force microscope tip.

Nuno C. Santos,* Evgeny Ter-Ovanesyan, Joseph A. Zasadzinski, and Miguel A. R. B. Castanho* Centro de Quı́mica-Fı́sica Molecular, Complexo I, Instituto Superior Técnico, Lisboa, Portugal; Departamento de Quı́mica e Bioquı́mica, Faculdade de Ciências da Universidade de Lisboa, Lisboa, Portugal; and Department of Chemical and Nuclear Engineering, University of California, Santa Barbara, California 93...

متن کامل

Tip-Jump Response of an Amplitude-Modulated Atomic Force Microscope

The dynamic behaviors of an Atomic Force Microscope are of interest, and variously unpredictable phenomena are experimentally measured. In practical measurements, researchers have proposed many methods for avoiding these uncertainties. However, causes of these phenomena are still hard to demonstrate in simulation. To demonstrate these phenomena, this paper claims the tip-jump motion is a predic...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Applied Physics Letters

سال: 2012

ISSN: 0003-6951,1077-3118

DOI: 10.1063/1.4760283